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We are looking for SoC/ASIC Digital Design Engineer with experience in Design for Test (DFT). An intimate knowledge and experience in scan chain insertion, compression scan technologies, memory built-in self-test (MBIST) and automatic test pattern generation (ATPG) is required for this position. Should follow systematic quality metrics driven ATPG pattern generation. It is highly desirable for candidate to possess hands-on knowledge of synthesis, verification and debugging Verilog testbenches.
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Job ID: 79568481
Skills:
Soc Architecture, Tcl, Python, Perl, HDLs, MBIST, ATPG flow implementation, UPF, Cadence digital implementation tools, DFT architecture definition, Tempus, CPF, Scan, Genus, tessent DFT, JTAG boundary scan
Skills:
Perl, Logic Design, Python, DFT Engineering, SV, Post Silicon Testing, Coverage metrics, Constrained random testing, Uvm, Profiling Tools, Architecture Verification
Skills:
Jtag, MBIST, FastScan, Scan Insertion, DFT architecture, ATPG, Synopsys TetraMax, EDT, Scan Compression, Stuck-at, At-speed, TestKompress, Mentor Tessent
Skills:
Perl, Scripting, Python, Tcl, scan compression, BSCAN, Simulation, MBIST, DFT insertion, ATPG, LBIST, pattern generation, IJTAG