cmp , Ms Office, Python coding, lithography, Metals, Statistics, GenAI programming, Dry etch processing, Wet etch, Statistical Process Control, process integration, cvd, Data science basics, diffusion

Ms Office, AI coding, Python coding, Statistical Process Control, plasma chemistry, plasma dry etch reactors, surface phenomena, data science basics, SAS software, dry etch process development, plasma physics, Jmp

Java, Statistical Analysis, C++, Data-driven decision-making, Oscilloscopes, THD, DACs, MEMS sensors, SmarTest 7, Dft, FFT, IIR filtering, SNR, ATE diagnostics, Advantest 93000, Digital communication interfaces, Process Optimization, ADCs, Spectrum analyzers, Frequency response analysis, Data analysis tools, Sampling theory, Software version control, Nyquist criteria

SAP, Ms Office, Excel, AOI, Statistical Analysis, Quality Systems, cleanroom practices, AI inspection, Spc, Root-cause analysis, Jmp, Capa, Minitab, Continuous Improvement, manual inspection, FACA, Mes

Statistical Analysis, Statistical process controls, process integration, Manufacturing Process, Backend and Reliability implications, device physics, Fabrication processes

Statistical Analysis, SAP, Ms Office, Excel, AOI, Quality Systems, AI inspection, Spc, Root-cause analysis, gd&t, Cleanroom practices, Capa, Jmp, Minitab, Manual inspection, FACA, Mes, Continuous Improvement