Ml, Data Analytics, Statistical Process Control, III-V epitaxial growth, Photoluminescence, AFM, Ai, Xrd, mocvd, sims, Sem, Hall measurement

statistical process control (SPC), new product introduction (NPI), Ml, Data Analytics, III-V epitaxial growth, Photoluminescence, Process Optimization, AFM, Ai, Xrd, advanced materials characterization tools, structure design for III-V materials, epitaxial growth mechanisms, mocvd, wafer fabrication, reactor dynamics, precursor chemistry, yield improvement, sims, Sem, device physics, Hall measurement